* written by unit test

* cell C2
* pin p1
* pin p2
.SUBCKT C2 n1 n2
* cell instance SC1 r0 *1 0,0
XSC1 n1 n2 C1
.ENDS C2

* cell C1
* pin p1
* pin p2
.SUBCKT C1 N1 N\x202
* device instance $1 r0 *1 0,0 XCLS
XD_$1 N1 n3 XCLS PARAMS: U=-17 V=42
* device instance $2 r0 *1 0,0 XCLS
XD_$2 n3 N\x202 XCLS PARAMS: U=17 V=-42
.ENDS C1